PIE highlights process risks and enables continuous improvement—a central principle of DevOps. PIE not only looks for patterns within defects identified in a specific test and analysis run, but also correlates the defects with observations over time—exposing defect injection patterns.
One of the greatest issues associated with test automation is the overwhelming volume of data it returns. When flooded with information, developers and testers are simply paralyzed. PIE solves this problem by automatically prioritizing observations according to predefined business objectives. PIE assigns metadata to the observation, which can then trigger an event within Parasoft DTP or any external system.
Metrics derived from the application of PIE serve as quality gates for determining the risk associated with releasing software, as well as feed back into Policy Center to optimize defect prevention for future cycles
Every organization faces different business risks–and within an organization, the risks confronting each project team also vary. To optimize the application of automated tools and analysis techniques, you can create “PIE slices,” which are custom chains of analytical data to identify the business risks hidden in the code.