Embedded World 2016
February 23-25, 2016
Tradeshow Appearance, Speaking Engagement
Parasoft will be demonstrating our solutions and presenting on February 24 from 4.30 pm – 5pm (under session 20), End-to-end Testing for IoT Integrity, at Embedded World in Nuremberg, Germany. Curious to learn more about our solutions? Visit us at hall 4-416!
IoT Dev + Test Conference
April 21, 2016 | 3:15pm - 4pm | San Diego, CA.
Wayne Ariola, Chief Strategist for Parasoft will be speaking at the upcoming IoT Dev+Test Conference this spring on IoT Integrity: A Guide to Robust Endpoint Testing.